Download e-book for iPad: Aberration-corrected Analytical Electron Microscopy by Rik Brydson

By Rik Brydson

ISBN-10: 0470518510

ISBN-13: 9780470518519

The ebook is worried with the idea, historical past, and useful use of transmission electron microscopes with lens correctors which may right the results of round aberration. The booklet additionally covers a comparability with aberration correction within the TEM and purposes of analytical aberration corrected STEM in fabrics technology and biology. This publication is vital for microscopists serious about nanoscale and fabrics microanalysis specially these utilizing scanning transmission electron microscopy, and comparable analytical ideas akin to electron diffraction x-ray spectrometry (EDXS) and electron power loss spectroscopy (EELS).

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A colour version of this figure appears in the plate section) 38 ABERRATION-CORRECTED ANALYTICAL TEM REFERENCES Boersch, H. (1954) Experimentelle Bestimmung der Energieverteilung in Thermisch ¨ Ausgelosten Elektronenstrahlen, Z. Phys. 139, 115–146. J. and Beanland, R. (2001) Electron Microscopy and Analysis, Taylor and Francis, New York. Hecht, E. ) Addison-Wesly-Longman, Reading MA. G. W. (1996) Atom Probe Field–ion Microscopy, Oxford University Press, Oxford. Mulvey, T. (1974) in Electron Microscopy 1974, Vol.

Hence if there is a combination of both diffraction and spherical aberration effects limiting the resolution, there must be an optimum figure for resolution as α changes. 7) 30 ABERRATION-CORRECTED ANALYTICAL TEM which is often quoted as a simple guide to microscope resolution. A more complete treatment of all these features is given in Chapters 4 and 6. 5 ELECTRON SOURCES A range of electron sources or electron guns is available for use in electron microscopes. The choice depends largely on the beam current and energy spread that are required, together with the vacuum which can be maintained in the gun chamber.

The approximation that a specimen is indeed a weak phase object is important for much of the treatment in Chapter 5. It should be obvious that such a specimen must be substantially thinner than the mean free path for all the inelastic scattering processes. In practice many biological specimens will meet this criterion at thicknesses below 50 nm, but specimens containing substantially heavier atoms would need to be much thinner. 3) 16 ABERRATION-CORRECTED ANALYTICAL TEM where E0 is the electron beam energy in keV, ρ the density in g/cm3 and Z and A are the atomic number and atomic weight respectively; note that b and t are in cm.

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Aberration-corrected Analytical Electron Microscopy by Rik Brydson


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